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Noise Contamination in Nanoscale VLSI Circuits

Noise Contamination in Nanoscale VLSI Circuits

Sayil, Selahattin

436,85 DKK

Soft Error Mechanisms, Modeling and Mitigation

Soft Error Mechanisms, Modeling and Mitigation

Sayil, Selahattin

436,85 DKK

Contactless VLSI Measurement and Testing Techniques

Contactless VLSI Measurement and Testing Techniques

Sayil, Selahattin

875,33 DKK

Contactless VLSI Measurement and Testing Techniques

Contactless VLSI Measurement and Testing Techniques

Sayil, Selahattin

875,33 DKK