VLSI Test Principles and Architectures e-bog
509,93 DKK
(inkl. moms 637,41 DKK)
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerou...
E-bog
509,93 DKK
Forlag
Morgan Kaufmann
Udgivet
14 august 2006
Længde
808 sider
Genrer
AKP
Sprog
English
Format
pdf
Beskyttelse
LCP
ISBN
9780080474793
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.