VLSI Test Principles and Architectures (e-bog) af Wen, Xiaoqing
Wen, Xiaoqing (forfatter)

VLSI Test Principles and Architectures e-bog

509,93 DKK (inkl. moms 637,41 DKK)
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerou...
E-bog 509,93 DKK
Forfattere Wen, Xiaoqing (forfatter), Huang, Shi-Yu (medforfatter)
Udgivet 14 august 2006
Længde 808 sider
Genrer AKP
Sprog English
Format pdf
Beskyttelse LCP
ISBN 9780080474793
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.