Dansk
Microscopy of Semiconducting Materials e-bog
2190,77 DKK
(inkl. moms 2738,46 DKK)
The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and als...
E-bog
2190,77 DKK
Forlag
Springer
Udgivet
25 august 2006
Genrer
PDD
Sprog
English
Format
pdf
Beskyttelse
LCP
ISBN
9783540319153
The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.