Takeyasu, Kunio
(redaktør)
Atomic Force Microscopy in Nanobiology e-bog
1021,49 DKK
Recent developments in atomic force microscopy (AFM) have been accomplished through various technical and instrumental innovations, including high-resolution and recognition imaging technology under physiological conditions, fast-scanning AFM, and general methods for cantilever modification and force measurement. All these techniques are now highly
E-bog
1021,49 DKK
Forlag
Jenny Stanford Publishing
Udgivet
19.04.2016
Længde
458 sider
Genrer
PDND
Sprog
English
Format
pdf
Beskyttelse
LCP
ISBN
9789814411592
Recent developments in atomic force microscopy (AFM) have been accomplished through various technical and instrumental innovations, including high-resolution and recognition imaging technology under physiological conditions, fast-scanning AFM, and general methods for cantilever modification and force measurement. All these techniques are now highly
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