Scanning Probe Microscopy (e-bog) af Gruverman, Alexei
Gruverman, Alexei (forfatter)

Scanning Probe Microscopy e-bog

2921,57 DKK (inkl. moms 3651,96 DKK)
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and na...
E-bog 2921,57 DKK
Forfattere Gruverman, Alexei (forfatter)
Forlag Springer
Udgivet 3 april 2007
Genrer PHFC
Sprog English
Format pdf
Beskyttelse LCP
ISBN 9780387286686
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.