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  3. Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis
Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis (e-bog) af Nobuo Tanaka, Tanaka
Nobuo Tanaka, Tanaka (forfatter)

Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis e-bog

473,39 DKK (inkl. moms 591,74 DKK)
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss ...
E-bog 473,39 DKK
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Forfattere Nobuo Tanaka, Tanaka (forfatter)
Forlag Imperial College Press
Udgivet 21 august 2014
Længde 616 sider
Genrer PHJ
Sprog English
Format epub
Beskyttelse LCP
ISBN 9781783264711

Beskrivelse

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.