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  3. SEM Microcharacterization of Semiconductors
SEM Microcharacterization of Semiconductors (e-bog) af -
Joy, D. C. (redaktør)

SEM Microcharacterization of Semiconductors e-bog

473,39 DKK (inkl. moms 591,74 DKK)
Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology. This book emphasizes the fundamental physical principles. The first section deals with the foundation of microcharacterization in electron beam instruments and the second deals with the interpretation of the information obtained in the m...
E-bog 473,39 DKK
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Forfattere Joy, D. C. (redaktør)
Forlag Academic Press
Udgivet 22 oktober 2013
Længde 452 sider
Genrer PHQ
Sprog English
Format pdf
Beskyttelse LCP
ISBN 9781483288673

Beskrivelse

Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology. This book emphasizes the fundamental physical principles. The first section deals with the foundation of microcharacterization in electron beam instruments and the second deals with the interpretation of the information obtained in the main operating modes of a scanning electron microscope.