Dansk
Semiconductor X-Ray Detectors e-bog
583,01 DKK
(inkl. moms 728,76 DKK)
Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium Drifted Silicon (Si(Li)) X-Ray Detector, with its
E-bog
583,01 DKK
Forlag
CRC Press
Udgivet
7 december 2013
Længde
624 sider
Genrer
Applied physics
Sprog
English
Format
pdf
Beskyttelse
LCP
ISBN
9781466554016
Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium Drifted Silicon (Si(Li)) X-Ray Detector, with its