Pattern Recognition and Artificial Intelligence (e-bog) af -
Chen, C.H. (redaktør)

Pattern Recognition and Artificial Intelligence e-bog

436,85 DKK (inkl. moms 546,06 DKK)
Pattern Recognition and Artificial Intelligence contains the proceedings of the Joint Workshop on Pattern Recognition and Artificial Intelligence held in Hyannis, Massachusetts, on June 1-3, 1976. The papers explore developments in pattern recognition and artificial intelligence and cover topics ranging from scene analysis and data structure to syntactic methods, biomedicine, speech recognition...
E-bog 436,85 DKK
Forfattere Chen, C.H. (redaktør)
Udgivet 11 december 2013
Længde 632 sider
Genrer Engineering: general
Sprog English
Format pdf
Beskyttelse LCP
ISBN 9780323144209
Pattern Recognition and Artificial Intelligence contains the proceedings of the Joint Workshop on Pattern Recognition and Artificial Intelligence held in Hyannis, Massachusetts, on June 1-3, 1976. The papers explore developments in pattern recognition and artificial intelligence and cover topics ranging from scene analysis and data structure to syntactic methods, biomedicine, speech recognition, game-playing programs, and computer graphics. Grammar inference methods, image segmentation and interpretation, and relational databases are also discussed. This book is comprised of 29 chapters and begins with a description of a data structure that can learn simple programs from training samples. The reader is then introduced to the syntactic parts of pattern recognition systems; methods for multidimensional grammatical inference; a scene analysis system capable of finding structure in outdoor scenes; and a language called DEDUCE for relational databases. A sculptor's studio-like environment, in which the "e;"e;sculptor"e;"e; can create complex three-dimensional objects in the computer similar to molding a piece of clay in the machine, is also described. The remaining chapters focus on statistical and structural feature extraction; use of maximum likelihood functions for recognition of highly variable line drawings; region extraction using boundary following; and interactive screening of reconnaissance imagery. This monograph will be of interest to engineers, graduate students, and researchers in the fields of pattern recognition and artificial intelligence.