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  3. Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Built-in-Self-Test and Digital Self-Calibration for RF SoCs (e-bog) af Ismail, Mohammed
Ismail, Mohammed (forfatter)

Built-in-Self-Test and Digital Self-Calibration for RF SoCs e-bog

436,85 DKK (inkl. moms 546,06 DKK)
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will res...
E-bog 436,85 DKK
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Forfattere Ismail, Mohammed (forfatter)
Forlag Springer
Udgivet 23 september 2011
Genrer Electronics engineering
Sprog English
Format pdf
Beskyttelse LCP
ISBN 9781441995483

Beskrivelse

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.