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  3. Terrestrial Neutron-induced Soft Error In Advanced Memory Devices
Terrestrial Neutron-induced Soft Error In Advanced Memory Devices (e-bog) af Hideaki Kameyama, Kameyama
Hideaki Kameyama, Kameyama (forfatter)

Terrestrial Neutron-induced Soft Error In Advanced Memory Devices e-bog

436,85 DKK (inkl. moms 546,06 DKK)
Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct...
E-bog 436,85 DKK
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Forfattere Hideaki Kameyama, Kameyama (forfatter)
Forlag World Scientific
Udgivet 28 marts 2008
Længde 368 sider
Genrer TJFD5
Sprog English
Format pdf
Beskyttelse LCP
ISBN 9789814472395

Beskrivelse

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.