PDND

Vis mig kun

Principles and Practice of Variable Pressure / Environmental Scanning Electron Microscopy (VP-ESEM)

Principles and Practice of Variable Pressure / Environmental Scanning Electron Microscopy (VP-ESEM)

Stokes, Debbie

656,09 DKK

Phase Transitions and Adsorbate Restructuring at Metal Surface

Phase Transitions and Adsorbate Restructuring at Metal Surface

Woodruff, D.P.

619,55 DKK

Life at the Edge of Sight

Life at the Edge of Sight

Roberto Kolter, Kolter

310,39 DKK

Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997

Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997

Rodenburg, John M.

436,85 DKK

Conn's Biological Stains

Conn's Biological Stains

Kiernan, John

2190,77 DKK

Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997

Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997

Rodenburg, John M.

436,85 DKK

Biological Microtechnique

Biological Microtechnique

Sanderson, Jeremy

436,85 DKK

Electron Energy Loss Spectroscopy

Electron Energy Loss Spectroscopy

Brydson, R.

802,25 DKK

Atomic Force Microscopy

Atomic Force Microscopy

Haugstad, Greg

1240,73 DKK

Diatom Microscopy

Diatom Microscopy

Gordon, Richard

2190,77 DKK

Fundamentals of Light Microscopy and Electronic Imaging

Fundamentals of Light Microscopy and Electronic Imaging

Davidson, Michael W.

1313,81 DKK

Atomic Force Microscopy for Energy Research

Atomic Force Microscopy for Energy Research

Shen, Cai

436,85 DKK

Low Voltage Electron Microscopy

Low Voltage Electron Microscopy

Erdman, Natasha

875,33 DKK

Scanning Probe Microscopy in Industrial Applications

Scanning Probe Microscopy in Industrial Applications

Yablon, Dalia G.

1094,57 DKK

Aberration-Corrected Analytical Transmission Electron Microscopy

Aberration-Corrected Analytical Transmission Electron Microscopy

Brydson, Rik

509,93 DKK

Biological Field Emission Scanning Electron Microscopy

Biological Field Emission Scanning Electron Microscopy

Humbel, Bruno M.

1459,97 DKK

Diatom Microscopy

Diatom Microscopy

Gordon, Richard

2190,77 DKK

Fundamentals of Light Microscopy and Electronic Imaging

Fundamentals of Light Microscopy and Electronic Imaging

Davidson, Michael W.

1313,81 DKK

Biological Field Emission Scanning Electron Microscopy

Biological Field Emission Scanning Electron Microscopy

Humbel, Bruno M.

1459,97 DKK

Electron Beam-Specimen Interactions and Simulation Methods in Microscopy

Electron Beam-Specimen Interactions and Simulation Methods in Microscopy

Mendis, Budhika G.

1021,49 DKK

Atomic Force Microscopy

Atomic Force Microscopy

Haugstad, Greg

1240,73 DKK

Scanning Probe Microscopy in Industrial Applications

Scanning Probe Microscopy in Industrial Applications

Yablon, Dalia G.

1094,57 DKK

Low Voltage Electron Microscopy

Low Voltage Electron Microscopy

Erdman, Natasha

875,33 DKK

Super-Resolution Microscopy

Super-Resolution Microscopy

Birk, Udo J.

875,33 DKK

Handbook of Nanoscopy

Handbook of Nanoscopy

Pennycook, Stephen J.

3652,37 DKK

In-situ Electron Microscopy

In-situ Electron Microscopy

Zweck, Josef

1240,73 DKK

Acoustic Microscopy

Acoustic Microscopy

Maev, Roman Gr.

2190,77 DKK

Scanning Probe Microscopy of Soft Matter

Scanning Probe Microscopy of Soft Matter

Singamaneni, Srikanth

1386,89 DKK

Negative Staining and Cryoelectron Microscopy

Negative Staining and Cryoelectron Microscopy

0 J.R. Harris,

436,85 DKK

Exploring Scanning Probe Microscopy with MATHEMATICA

Exploring Scanning Probe Microscopy with MATHEMATICA

Sarid, Dror

2190,77 DKK